NI pxi Vector Network Analyzer, assisted semiconductor and mobile testing

Source: Internet
Author: User
Keywords Mobile testing NI company semiconductor testing Vector network analyzer
Tags advanced applications assisted automatic based company cost development

News points

· The NI Vector Network Analyzer (VNA) can reduce the cost of testing by virtue of its rapid automatic measurement, powerful instrument structure and simplified test system development process.

· New NI PXI Express module?? It integrates the measurement function of the Advanced Vector Network analyzer, and forms a test system based on PXI, which includes high precision DC, high speed simulation and digital measurement applications.

Press Release-in December 2012, the National Instruments Corporation (limited, NI) recently released Ni Ni PXIe-5632 VNA, which has been further optimized to help engineers meet the increasingly complex RF test requirements, and its cost, The size and time required for use are only a small fraction of the traditional tiered solution. The new Pxie VNA is based on an innovative dual-source architecture, with a frequency range of between khz and 8.5 GHz, with an independently tuned source code and an access cycle that can be applied to many different measurement applications.

"NI continues to invest heavily in RF and microwave instruments to extend the application of PXI to high-end applications." "Ni PXIe-5632 Vector network Analyzer is rich in functionality and can significantly reduce network measurement costs, especially for high-volume automated tests that require highly accurate, fast, and small package measurements," said Jin Bains, vice president of NI RF research and development. ”

Product Features

· Dual-port, 3-slot PXI Express Vector Network Analyzer with a frequency range of khz to 8.5 GHz.

· The power range is wide, for -30dbm to +15 dBm, and the adjustment step is 0.01dB to measure the compression and S-parameters of the active device.

· Dual-source architecture with source access cycle can realize pulse s parameter measurement and extend source power range.

· The frequency offset function uses the independent adjustment source code, realizes to the frequency conversion device and the hot s parameter measurement.

· With industry-leading programming interfaces such as NI LabVIEW, ANSI C and. NET, you can simplify programming and speed test development while ensuring the quality of RF measurements.

For more information, please visit http://www.ni.com/vna/zhs/.

About NI

Since 1976, the United States National Instrumentation, abbreviation NI (www.ni.com) has been dedicated to engineers and scientists to provide various tools to improve efficiency, speed up innovation and exploration. The design method of NI's graphical system provides an integrated software and hardware platform for Engineering circle, which helps to accelerate the development of measurement and control system. NI has long been looking for and striving to improve social development through its own technology to ensure the success of customers, employees, suppliers and shareholders.

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